Misleading fringes in TEM images and diffraction patterns of Si nanocrystallites

Abstract

Abstract High‐resolution transmission electron microscopy (HRTEM) images and electron diffraction patterns of twinned Si nanocrystallites were recorded along various directions and analyzed in detail. We point out that special attention must be paid when interpreting HRTEM images and diffraction patterns of twinned Si nanocrystallites, because elongation of reciprocal lattice points could fabricate misleading fringes and patterns. (© 2003 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)