Efficient phase contrast imaging in STEM using a pixelated detector. Part II: Optimisation of imaging conditions

Relativistic Hartree–Fock X-ray and electron scattering factors

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The Theoretical Resolution Limit of the Electron Microscope

Otto Scherzer · Journal of Applied Physics · 1949 · 916 citations

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The investigation of magnetic domain structures in thin foils by electron microscopy

J. N. Chapman · Journal of Physics D Applied Physics · 1984 · 482 citations

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