Measurement of the Lifetime of Minority Carriers in Semiconductors with a Scanning Electron Microscope - Concepedia

Concepedia

Publication | Closed Access

Measurement of the Lifetime of Minority Carriers in Semiconductors with a Scanning Electron Microscope

45

Citations

1

References

1965

Year

Hisayuki Higuchi, Hifumi Tamura

Japanese Journal of Applied Physics

SemiconductorsSemiconductor TechnologyEngineeringPhysicsApplied PhysicsMinority CarriersSemiconductor MaterialScanning Electron MicroscopeDevice ReliabilityCompound SemiconductorSemiconductor Device

References

	Year	Citations

Page 1