Test data compression using alternating variable run-length code

System-on-a-chip test-data compression and decompression architectures based on Golomb codes

Anshuman Chandra, Krishnendu Chakrabarty · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2001 · 363 citations

Hardware Security, System On Chip, Golomb Codes +15

Static compaction techniques to control scan vector power dissipation

Rajkumar Sankaralingam, R. Oruganti, Nur A. Touba · 2002 · 352 citations

Numerical Analysis, Electrical Engineering, Engineering +14

Test data compression and test resource partitioning for system-on-a-chip using frequency-directed run-length (FDR) codes

Anshuman Chandra, Krishnendu Chakrabarty · IEEE Transactions on Computers · 2003 · 229 citations

Engineering, Test Resource, Computer Architecture +19

Variable-length input huffman coding for system-on-a-chip test

P.T. Gonciari, Bashir M. Al‐Hashimi, Nicola Nicolici · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2003 · 167 citations

Hardware Security, Engineering, Tdce Parameters +15

A unified approach to reduce soc test data volume, scan power and testing time

Anshuman Chandra, Krishnendu Chakrabarty · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2003 · 161 citations

Engineering, Computer Architecture, Test Data Generation +23