Publication | Closed Access
Optical properties of CdSe films deposited by the quasi-closed volume technique
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Citations
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References
2000
Year
Atomic Force MicroscopyOptical MaterialsEngineeringThin Film Process TechnologyIi-vi SemiconductorOptical PropertiesX-ray Diffraction TechniqueCompound SemiconductorThin Film ProcessingQuasi-closed Volume TechniqueMaterials ScienceNanotechnologyCdse FilmsSemiconductor MaterialNanocrystalline MaterialNanomaterialsApplied PhysicsThin FilmsOptoelectronics
Polycrystalline CdSe thin films (d = 0.08-1.65 µm) have been prepared by the quasi-closed volume technique under vacuum on glass substrates. The film structure was studied by the x-ray diffraction technique and atomic force microscopy.
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