XRD and XPS characterisation of transition metal silicide thin films

Handbook of X-Ray Photoelectron Spectroscopy

J. F. Moulder · Medical Entomology and Zoology · 1995 · 23.7K citations

Natural Sciences, Chemistry, Materials Science +10

Two-dimensional chemical state plots: a standardized data set for use in identifying chemical states by x-ray photoelectron spectroscopy

C. D. Wagner, L. H. Gale, R. Raymond · Analytical Chemistry · 1979 · 683 citations

Natural Sciences, Chemistry, Analytical Chemistry +8

Summary of ISO/TC 201 Standard: VII ISO 15472 : 2001—surface chemical analysis—x‐ray photoelectron spectrometers—calibration of energy scales

M. P. Seah · Surface and Interface Analysis · 2001 · 315 citations

Natural Sciences, Chemistry, Materials Science +16

An XPS study of Si as it occurs in adsorbents, catalysts, and thin films

Tery L. Barr · Applications of Surface Science · 1983 · 296 citations

Natural Sciences, Chemistry, Materials Science +13

Key developments in high temperature structural silicides

J. J. Petrovic, A.K. Vasudévan · Materials Science and Engineering A · 1999 · 289 citations

Natural Sciences, Materials Engineering, Materials Science +9