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Effect of Si in reactively sputtered Ti-Si-N films on structure and diffusion barrier performance
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1997
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Materials ScienceMaterials EngineeringDiffusion Barrier PerformanceEngineeringNanoelectronicsSurface ScienceApplied PhysicsSemiconductor MaterialSemiconductor Device FabricationThin FilmsSilicon On InsulatorMicroelectronicsThin Film ProcessingTi-si-n Films
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