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Dynamic investigation of electron trapping and charge decay in electron-irradiated Al2O3 in a scanning electron microscope: Methodology and mechanisms

Materials ScienceEngineeringElectron MicroscopyPhysicsMicroscopyElectron SpectroscopyScanning Probe MicroscopyApplied PhysicsCharge DecayElectron MicroscopeScanning Electron MicroscopeElectron OpticElectron Trapping