Diffraction-line shift caused by residual stress in polycrystal for all Laue groups in classical approximations

Abstract

Analytical formulae for all Laue groups are derived, giving the dependence of the residual elastic strain measured by X-ray and neutron diffraction on the direction in the sample and on the Miller indices. These formulae are valid for isotropic polycrystals in the limits of the Reuss and Voigt approximations and are appropriate for Rietveld refinement.