Publication | Closed Access
Sample preparation by focused ion beam micromachining for transmission electron microscopy imaging in front-view
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Citations
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References
2013
Year
EngineeringElectron MicroscopyTransmission Electron MicroscopyMicrofabricationMicroscopyMicroscopy MethodSample PreparationApplied PhysicsBiomedical ImagingElectron MicroscopeIon BeamBiomedical EngineeringInstrumentationFocused Ion BeamImagingRadiology
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