physica status solidi (RRL) - Rapid Research Letters · 2008 · 14 citations · 5 references
EngineeringMaterials EngineeringMaterials ScienceElectronic MaterialsSemiconductor DevicesSemiconductor MaterialsCarrier TransportPhotovoltaic DevicesSemiconductor Device MaterialsSilicon MaterialsSolar Cell MaterialsSolar CellsCurrentsEquivalent Series ResistanceFill FactorSeries ResistanceSiliconSilicon Electrical PropertiesSilicon Solar CellsSolar Cell Device Physics
Abstract Low fill factors generally limit the efficiency of emitter‐wrap‐through (EWT) solar cells. Until now, a conventional series resistance limitation along the laser‐drilled EWT vias has usually been assumed to be responsible for this effect. We demonstrate that the characteristic fill factor loss is caused by a crucial change in the diffusion currents inside the base, which are influenced by the conductivity along the laser‐drilled EWT vias. In addition, we show that the EWT via conductivity influences the fill factor loss caused by an iron contaminated base. This result affects the proposition that the EWT design is suitable for multicrystalline silicon in which interstitial iron is known to be the main contaminant. (© 2008 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)
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Iron and its complexes in silicon
A. A. Istratov, H. Hieslmair, E. R. Weber · Applied Physics A · 1999 · 536 citations
Emitter wrap-through solar cell
J.M. Gee, W. K. Schubert, Paul A. Basore · 2002 · 92 citations