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Carrier dynamics in nitride-based light-emitting p-n junction diodes with two active regions emitting at different wavelengths
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Citations
12
References
2003
Year
EngineeringCarrier DynamicsRoom-temperature Electroluminescence MeasurementsDifferent WavelengthsLight-emitting DiodesCompound SemiconductorExcitation IntensityLuminous EfficacyPhotonicsElectrical EngineeringPhotoluminescencePhysicsNew Lighting TechnologyAluminum Gallium NitrideCategoryiii-v SemiconductorSolid-state LightingActive RegionsApplied PhysicsGan Power DeviceOptoelectronics
The carrier transport and recombination dynamics of monolithic InGaN/GaN light-emitting p-n junction structures with two active regions are investigated. Room-temperature and low-temperature photoluminescence and room-temperature electroluminescence measurements show two emission bands originating from the two active regions. In electroluminescence, the intensity ratio of the two emission bands is independent of injection current. In contrast, the intensity ratio depends strongly on the excitation intensity in photoluminescence measurements. The dependency of the emission on excitation is discussed and attributed to carrier transport between the two active regions and to the different carrier injection dynamics in photoluminescence and electroluminescence. The luminous efficacy of a Gaussian dichromatic white-light source is calculated assuming a line broadening ranging from 2kT to 10kT. Luminous efficacies ranging from 380 to 440 lm/W are obtained for broadened dichromatic sources.
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