Applied Surface Science · 1995 · 34 citations · 3 references
Natural SciencesPhysicsAtomic PhysicsCrystal StructureAtomic PackingCrystal ChemistryCrystal LatticeCrystallographyStructure DeterminationX-ray CrystallographyAtom LocalizationAtomic Position DeterminationCrystal Structure AnalysisCrystal Structure DeterminationCrystallographic Modeling
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Materials analysis with a position‐sensitive atom probe
A. Cerezo, T. J. Godfrey, C.R.M. Grovenor et al. · Journal of Microscopy · 1989 · 56 citations