Investigation of process parameter variation in the memristor based resistive random access memory (RRAM): Effect of device size variations - Concepedia

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Investigation of process parameter variation in the memristor based resistive random access memory (RRAM): Effect of device size variations

51

Citations

13

References

2015

Year

Tukaram D. Dongale, K.P. Patil, Sajid B. Mullani, Krantiveer V. More, Sagar D. Delekar, Pramod S. Patil, P. K. Gaikwad, Rajanish K. Kamat

Materials Science in Semiconductor Processing

Electrical EngineeringEngineeringComputer EngineeringMemoryProcess Parameter VariationMemory DeviceMemory DevicesSemiconductor MemoryResistive Random-access MemoryMicroelectronicsPhase Change MemoryDevice Size Variations

References

	Year	Citations

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