A lucky drift model, including a soft threshold energy, fitted to experimental measurements of ionization coefficients

Handbook of Mathematical Functions

Donald A. McQuarrie · American Journal of Physics · 1966 · 40.9K citations

Natural Sciences, Mathematics, Differential Equations +10

Multiplication noise in uniform avalanche diodes

R.J. McIntyre · IEEE Transactions on Electron Devices · 1966 · 1.4K citations

Engineering, Electrical Engineering, Circuit Theory +14

Problems related to p-n junctions in silicon

W. Shockley · Solid-State Electronics · 1961 · 917 citations

Engineering, Materials Science, Physics +12

Distribution Functions and Ionization Rates for Hot Electrons in Semiconductors

G. A. Baraff · Physical Review · 1962 · 517 citations

Natural Sciences, Physics, Electronic Materials +12

Ionization Rates of Holes and Electrons in Silicon

C. A. Lee, R. A. Logan, R. L. Batdorf et al. · Physical Review · 1964 · 475 citations

Engineering, Electrical Engineering, Physics +16