Concepedia

Lattice defect investigation of ECAP-Cu by means of X-ray line profile analysis, calorimetry and electrical resistometry

Erhard Schafler, G. Steïner, Elena A. Korznikova, Michael Kerber, M. Zehetbauer

Materials Science and Engineering A · 2005 · 180 citations · 13 references

DOI

Concepts

References

13

X-ray line broadening from filed aluminium and wolfram

G.K. Williamson, W H Hall · Acta Metallurgica · 1953 · 10.2K citations

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Bulk nanostructured materials from severe plastic deformation

Rinat K. Islamgaliev, Igor Alexandrov · Progress in Materials Science · 2000 · 6.4K citations

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The Effect of Cold-Work Distortion on X-Ray Patterns

Β. E. Warren, B. L. Averbach · Journal of Applied Physics · 1950 · 1.4K citations

, , +16

The effect of dislocation contrast on x-ray line broadening: A new approach to line profile analysis

T. Ungár, A. Borbély · Applied Physics Letters · 1996 · 1.3K citations

, , +17

Crystallite size distribution and dislocation structure determined by diffraction profile analysis: principles and practical application to cubic and hexagonal crystals

T. Ungár, Jenő Gubicza, Gábor Ribárik et al. · Journal of Applied Crystallography · 2001 · 773 citations

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