Task Migrations for Distributed Thermal Management Considering Transient Effects

Abstract

In this brief, a new distributed thermal management scheme using task migrations based on a new temperature metric called effective initial temperature is proposed to reduce the on-chip temperature variance and the occurrence of hot spots for many-core microprocessors. The new temperature metric derived from frequency domain moment matching technique incorporates both initial temperature and other transient effects to make optimized task migration decisions, which leads to more effective reduction of hot spots in the experiments on a 100-core microprocessor than the existing distributed thermal management methods.