Observation of Intrinsic Josephson Junction Properties on (Bi,Pb)SrCaCuO Thin Films

Abstract

We have fabricated intrinsic Josephson junctions for (Bi,Pb) 2 Sr 2 Ca 2 Cu 3 O x thin films and investigated their electronic characteristics. Mesa structures with the junctions are fabricated on the surface of high-quality films prepared by rf-sputtering and subsequent heat treatment. The junctions show distinct hysteresis and a multiple branching structure with a periodic voltage jump at a current-voltage response. These results demonstrate that the fabricated mesas consist of stacked series SIS junctions. From this periodic structure, a voltage jump of 26–28 mV is obtained for the 2223 phase at 4.2 K.