Numerical analysis of Double Gate and Gate All Around MOSFETs with bulk trap states - Concepedia

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Numerical analysis of Double Gate and Gate All Around MOSFETs with bulk trap states

29

Citations

8

References

2007

Year

M.A. Abdi, F. Djeffal, D. Arar, Mohamed Lamine Hafiane

Journal of Materials Science Materials in Electronics

Numerical AnalysisDevice ModelingElectrical EngineeringEngineeringPhysicsBias Temperature InstabilityBulk Trap StatesMicroelectronicsCircuit AnalysisCircuit SimulationDouble Gate

References

	Year	Citations

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