Formation of Ge nanocrystals in HfAlO high-k dielectric and application in memory device

Abstract

Formation of Ge nanocrystals embedded in HfAlO high-k dielectric by co-sputtering of HfO2, Al2O3, and Ge, followed by rapid thermal annealing was demonstrated. Analysis by transmission electron microscopy and x-ray photoelectron spectroscopy confirmed the formation of nonoxidized Ge nanocrystals with a minimum size of about 5nm embedded in HfAlO dielectric. We also demonstrated the application of such nanocrystals in nonvolatile memory devices, achieving a 2.2V memory window as obtained from the C–V characterization of the memory device.