Variable SAW delay line using amorphous TbFe<inf>2</inf>film

Abstract

This paper describes a large SAW velocity change obtained in a delay line consisting of an amorphous TbFe <inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</inf> film on a LiNbO <inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">3</inf> substrate. When an external bias field of about 4 kOe was applied parallel to the direction of SAW propagation, the percentage velocity change attained was -0.27 %. The value of this change is several times as large as that previously reported. The delay line may be used for trimming a small amount of delay time and tuning oscillation frequencies in an SAW oscillator.