Distance dependence of noncontact-AFM image contrast on Si(111) × –Ag structure - Concepedia

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Distance dependence of noncontact-AFM image contrast on Si(111) × –Ag structure

51

Citations

15

References

1999

Year

T. Minobe, Takayuki Uchihashi, Takahiro Tsukamoto, S. Orisaka, Yasuhiro Sugawara, Seizo Morita

Applied Surface Science

Materials ScienceSurface CharacterizationEngineeringMicroscopyNoncontact-afm Image ContrastApplied PhysicsDistance Dependence–Ag StructureOptical CharacterizationSilicon On Insulator

References

	Year	Citations

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