Applied Physics Letters · 1988 · 19 citations · 8 references
Natural SciencesMaterials SciencePhysicsCondensed Matter PhysicsElectronic MaterialsThin FilmsCrystal GrowthEpitaxial GrowthSemiconductor Crystal GrowthSemiconductor Thin FilmsThin-film MaterialsAtomic Layer EpitaxyEpitaxial Film GrowthEpitaxial Growth KineticsEpitaxial Thin-film GrowthFilm Growth MechanismsGrowth Parameters EstimationSubstrate Temperature EffectsThin-film Growth Mechanisms
Atomic-layer epitaxy of (111)CdTe single crystalline films on (111)BaF2 substrates is investigated. It is shown that a set of growth parameters exists in which the average growth per cycle of opening and closing the shutters of the constituent element sources is one monolayer. In a substrate temperature range between 260 and 285 °C the growth process is self-regulative, that means, it is independent of the Te beam intensity and the substrate temperature. At substrate temperatures higher than 285 °C growth is still self-regulative, but the average growth rate per cycle is less than one monolayer.
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C. H. L. Goodman, M. Pessa · Journal of Applied Physics · 1986 · 294 citations
Natural Sciences, Materials Engineering, Materials Science +17