Modeling and acoustic microscopy measurements for evaluation of the adhesion between a film and a substrate

A model for predicting acoustic material signatures

R.D. Weglein · Applied Physics Letters · 1979 · 190 citations

Natural Sciences, Materials Science, Physics +17

SAW dispersion and film-thickness measurement by acoustic microscopy

R.D. Weglein · Applied Physics Letters · 1979 · 27 citations

Natural Sciences, Materials Science, Physics +17

Characterization of thin films using numerical inversion of the generalized Lamb wave dispersion relation

Oliver Behrend, Andrzej Kulik, G. Gremaud · Applied Physics Letters · 1993 · 27 citations

Natural Sciences, Materials Engineering, Materials Science +17

Integration of modeling and acoustic microscopy measurements for thin films

Zhiqi Guo, J. D. Achenbach, Anita Madan et al. · The Journal of the Acoustical Society of America · 2000 · 11 citations

Natural Sciences, Materials Engineering, Materials Science +17