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Time-resolved and excitation-dependent photoluminescence study of CdTe/MgCdTe double heterostructures grown by molecular beam epitaxy
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Citations
9
References
2014
Year
Materials ScienceSemiconductorsIi-vi SemiconductorOptical MaterialsExcitation-dependent Photoluminescence StudyLow Defect DensitiesEngineeringPhotoluminescenceOptical PropertiesCompound SemiconductorOptoelectronic MaterialsApplied PhysicsOptoelectronic DevicesMolecular Beam EpitaxyLuminescence PropertyOptoelectronicsCdte/mgcdte Double Heterostructures
This Letter reports the optical properties of CdTe/MgCdTe double heterostructures grown by molecular beam epitaxy. Low-temperature photoluminescence shows strong band-to-band emission and very weak defect related peaks, indicating low defect densities. The measured Shockley–Read–Hall lifetimes range from 57 to 86 ns at room temperature for samples grown under different conditions. The material radiative recombination coefficient B in the recombination rate defined as R=AΔn+(1−γ)BΔn2+CΔn3 [Wang et al., Phys. Status Solidi B 244, 2740 (2007)] is evaluated to be 4.3 ± 0.5 × 10−9 cm3·s−1 with a photon recycling factor γ of 0.85 calculated based on the geometric structure of the samples.
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