Point Defects in Pb-, Bi-, and In-Doped CdZnTe Detectors: Deep-Level Transient Spectroscopy (DLTS) Measurements - Concepedia

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Point Defects in Pb-, Bi-, and In-Doped CdZnTe Detectors: Deep-Level Transient Spectroscopy (DLTS) Measurements

DOI Full Paper Access

29

Citations

10

References

2011

Year

R. Gul, K. Keeter, Rene Rodriguez, A. E. Bolotnikov, A. Hossain, G. S. Camarda, Kyoung Heon Kim, Ge Yang, Y. Cui, V. Carcelén,

Journal of Electronic Materials

Ii-vi SemiconductorDeep-level Transient SpectroscopyPoint DefectsEngineeringPhysicsIn-doped Cdznte DetectorsNatural SciencesSpectroscopyElectron SpectroscopyApplied PhysicsDefect FormationDetector PhysicDefect Tolerance

References

	Year	Citations

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