Imaging the life story of nanotube devices

Abstract

Live imaging of operating multiwall carbon nanotube (MWCNT-) based electronic devices is performed by high resolution transmission electron microscopy. Our measurements allow us to correlate electronic transport with changes in device structure. Surface contamination, contact annealing, and sequential wall removal are observed. Temperature profiles confirm diffusive conduction in MWCNTs in the high bias limit. This technique provides a general platform for studying nanoscale systems, where geometric configuration and electronic transport are intimately connected.