MRS Proceedings · 1993 · 77 citations · 8 references
Natural SciencesMaterials EngineeringMaterials ScienceElectronic MaterialsSemiconductor DevicesThin FilmsElectrode MaterialsMaterial DegradationMaterial Degradation AssessmentSemiconductor ReliabilitySurface DegradationThin Film Electrical PropertiesLead Zirconate Titanate
8
Device modeling of ferroelectric capacitors
S. L. Miller, R.D. Nasby, J.R. Schwank et al. · Journal of Applied Physics · 1990 · 385 citations
Natural Sciences, Electrical Engineering, Materials Science +17