Molecular beam epitaxial growth of a novel strained-layer superlattice system: CdTe-ZnTe

Abstract

CdTe-ZnTe strained-layer superlattices have been grown for the first time using the molecular beam epitaxy technique. The superlattices have been grown at 285 °C. They have been characterized by electron and x-ray diffraction. The presence of satellite peaks in the x-ray spectra shows that the superlattices are of excellent quality despite the large mismatch between CdTe and ZnTe along the growth axis (Δa/a=6.4%). X-ray oscillation patterns show that the superlattices are three-dimensional crystals.