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L-shell photoelectric cross section measurements
26
Citations
5
References
1981
Year
Absolute YieldPhotoelectric SensorEngineeringPhysicsElectron SpectroscopyOptical PropertiesSpectroscopyNatural SciencesApplied PhysicsPhotoelectric MeasurementX-ray Free-electron LaserFluorescent X-raysOptoelectronicsHidden Systematic ErrorsX-ray Fluorescence
L-shell photoelectric cross sections in Ta, W, Au, Pb, Th and U at 59.5 keV have been determined using three different versions of Sood's method of measuring the absolute yield of fluorescent X-rays when a target is irradiated with a known flux of photons. The results obtained by all the methods agree with one another showing that no hidden systematic errors are involved in the measurements. The present results are found to compare well with the theoretical calculations of Scofield (1973).
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