Publication | Closed Access
Synchrotron-radiation plane-wave topography II. Comparison between experiments and computer simulations for misfit-dislocation images in III-V heterojunctions
66
Citations
13
References
1980
Year
EngineeringMisfit-dislocation ImagesMechanics Of MaterialsX-ray ImagingOptical PropertiesDistorted CrystalsX-ray PropagationPhysicsCrystalline DefectsStrain LocalizationSolid MechanicsDefect FormationComputer SimulationsSynchrotron RadiationCrystallographyDislocation ImagesMicrostructureDislocation InteractionX-ray DiffractionApplied PhysicsX-ray OpticIii-v HeterojunctionsDiffractive Optic
Abstract A computer program based on the Takagi-Taupin differential equations for X-ray propagation in distorted crystals has been developed in order to simulate dislocation images in the Bragg case. The program is valid both for thin and thick crystals. Simulated images of misfit dislocations formed either in a thin epilayer or in a thick substrate are compared with experimental images obtained by synchrotron-radiation plane-wave topography. The influence of the various strain components on the image features is discussed.
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