Progress in cellular analysis using ToF-SIMS

A C₆₀ Primary Ion Beam System for Time of Flight Secondary Ion Mass Spectrometry:  Its Development and Secondary Ion Yield Characteristics

Daniel E. Weibel, Steve Wong, Nicholas P. Lockyer et al. · Analytical Chemistry · 2003 · 539 citations

Natural Sciences, Chemistry, Materials Science +15

Characterization of Adsorbed Protein Films by Time-of-Flight Secondary Ion Mass Spectrometry with Principal Component Analysis

Matt Wagner, David G. Castner · Langmuir · 2001 · 409 citations

Life Sciences, Biochemistry, Chemistry +17

Atomic and Molecular Imaging at the Single-Cell Level with TOF-SIMS

Thomas L. Colliver, Christopher L. Brummel, Michaeleen L. Pacholski et al. · Analytical Chemistry · 1997 · 259 citations

Natural Sciences, Biology, Chemistry +14

Development and experimental application of a gold liquid metal ion source

Noel W. Davies, Daniel E. Weibel, Paul Blenkinsopp et al. · Applied Surface Science · 2002 · 221 citations

Natural Sciences, Chemistry, Materials Science +7

Principal component analysis of multivariate images

Paul Geladi, Hans Isaksson, Lennart Lindqvist et al. · Chemometrics and Intelligent Laboratory Systems · 1989 · 185 citations

Computing, Computer Science, Digital Imaging +7