The role of total-reflection X-ray fluorescence in atomic spectroscopy

Glancing-incidence x-ray fluorescence of layered materials

Dick K. G. de Boer · Physical review. B, Condensed matter · 1991 · 350 citations

Natural Sciences, Materials Engineering, Materials Science +14

Inorganic mass spectrometry

F. Adams, R. Gijbels, R. Van Grieken et al. · Analytica Chimica Acta · 1989 · 216 citations

Determination of the critical thickness and the sensitivity for thin-film analysis by total reflection X-ray fluorescence spectrometry

R. Klockenkämper, Alex von Bohlen · Spectrochimica Acta Part B Atomic Spectroscopy · 1989 · 144 citations

Natural Sciences, Chemistry, Materials Science +14

Inorganic Mass Spectrometry

Analytical Chemistry · 1989 · 141 citations

Natural Sciences, Chemistry, Analytical Chemistry +5

Total reflection X-ray spectrometry: method and applications

Andreas Prange · Spectrochimica Acta Part B Atomic Spectroscopy · 1989 · 134 citations

Natural Sciences, Chemistry, Analytical Chemistry +5