Publication | Open Access
X-ray-absorption fine structure in embedded atoms
156
Citations
9
References
1994
Year
X-ray CrystallographyOscillatory StructureX-ray SpectroscopyAtomic XafsPhysicsEngineeringNatural SciencesSpectroscopyEmbedded AtomsApplied PhysicsX-ray DiffractionAtomic PhysicsPhysical ChemistryQuantum ChemistryChemistryAtomic Background AbsorptionX-ray Free-electron LaserCrystallography
Oscillatory structure is found in the atomic background absorption in x-ray-absorption fine-structure (XAFS) measurements. This atomic XAFS (AXAFS) arises from scattering within an embedded atom, and is analogous to the Ramsauer-Townsend effect. Calculations and measurements confirm the existence of AXAFS and show that it can dominate contributions such as multielectron excitations. The structure is sensitive to chemical effects and thus provides a probe of bonding and exchange effects on the scattering potential.
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