Journal of Physics D Applied Physics · 1994 · 10 citations · 5 references
EngineeringElectrical EngineeringMicrowave EngineeringOpticsPhotonicsMicrowave MeasurementsOptical InstrumentsScanning Probe MicroscopyUltrafast OpticsElectro-optic SamplingMicrowave DevicesNear-field Optical MicroscopyNear-field OpticsNear-field ScanningNear-field Scanning Optical MicroscopyScanning Near-field Optical MicroscopyTime-resolved Microscopy
The applicability of a near-field scanning optical microscope (NSOM) to measure ultrafast phenomena is experimentally demonstrated. For this application a commercial NSOM is combined with a picosecond laser sampling system. The ability of this time resolved NSOM to perform function and failure analysis of microwave devices is demonstrated. Measurements of high speed electric signals up to 7.5 GHz via the direct electro-optic sampling technique are performed.
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Near-field differential scanning optical microscope with atomic force regulation
Ricardo Toledo‐Crow, Pan Yang, Y. Chen et al. · Applied Physics Letters · 1992 · 459 citations