Publication | Closed Access
Comparison between nanoindentation and scratch test hardness (scratch hardness) values of copper thin films on oxidised silicon substrates
95
Citations
18
References
2006
Year
Materials ScienceMaterials EngineeringSurface CharacterizationEngineeringMicrofabricationSurface ScienceApplied PhysicsThin FilmsElectronic PackagingMicroelectronicsTest HardnessSurface ProcessingOxidised Silicon SubstratesCopper Thin FilmsThin Film Processing
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