Dual-Phase Tapped-Delay-Line Time-to-Digital Converter With On-the-Fly Calibration Implemented in 40 nm FPGA

Abstract

This paper describes two novel time-to-digital converter (TDC) architectures. The first is a dual-phase tapped-delay-line (TDL) TDC architecture that allows us to minimize the clock skew problem that causes the highly nonlinear characteristics of the TDC. The second is a pipelined on-the-fly calibration architecture that continuously compensates the nonlinearity and calibrates the fine times using the most up-to-date bin widths without additional dead time. The two architectures were combined and implemented in a single Virtex-6 device (ML605, Xilinx) for time interval measurement. The standard uncertainty for the time intervals from 0 to 20 ns was less than 12.83 ps-RMS (root mean square). The resolution (i.e., the least significant bit, LSB) of the TDC was approximately 10 ps at room temperature. The differential nonlinearity (DNL) values were [-1.0, 1.91] and [-1.0, 1.88] LSB and the integral nonlinearity (INL) values were [-2.20, 2.60] and [-1.63, 3.93] LSB for the two different TDLs that constitute one TDC channel. During temperature drift from 10 to 50(°)C, the TDC with on-the-fly calibration maintained the standard uncertainty of 11.03 ps-RMS.