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<title>Tandem limiter optimization</title>
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1994
Year
Optical MaterialsEngineeringNonlinear OpticsWave OpticOptical TestingConstrained OptimizationOptical CharacterizationOptical PropertiesTandem Limiter OptimizationOptical SystemsOptical SpectroscopyPhotonicsPhysicsNon-linear OpticSingle Ez-scan MeasurementNonlinear CrystalsWavefront DistortionOptimization ProblemApplied PhysicsOptical System AnalysisNonlinear Refraction
The EZ-scan, an improved Z-scan technique, shows a sensitivity for measuring nonlinearly induced wavefront distortion of approximately equals (lambda) /10<SUP>4</SUP>. We show that the nonlinear refraction and nonlinear absorption coefficients can be determined separately by a single EZ-scan measurement. We describe application of this technique to several organic thin films.