Publication | Closed Access
Monte Carlo study of secondary electron emission from SiO2 induced by focused gallium ion beams
35
Citations
13
References
2004
Year
Ion ImplantationEngineeringPhysicsMonte-carlo ModellingSecondary Electron EmissionApplied PhysicsMonte Carlo StudyIon BeamIon Emission
| Year | Citations | |
|---|---|---|
Page 1
Page 1