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Photoluminescence study of AlGaN-based 280 nm ultraviolet light-emitting diodes
77
Citations
12
References
2003
Year
Optical MaterialsEngineeringOptoelectronic DevicesLuminescence PropertySemiconductorsElectronic DevicesOptical PropertiesLight-emitting DiodesTemperature-dependent PhotoluminescenceIntegrated Pl IntensityCompound SemiconductorPhotonicsElectrical EngineeringPhotoluminescencePhysicsPeak EnergyOptoelectronic MaterialsAluminum Gallium NitridePhotoluminescence StudySolid-state LightingApplied PhysicsOptoelectronics
We investigated optical properties of single quantum well AlGaN-based UV 280 nm light-emitting diodes using temperature-dependent photoluminescence (PL) measurement. We found an “S-shaped” temperature dependence of the peak energy. From the Arrhenius plot of integrated PL intensity, we speculate that dislocations as well as thermal emission of carriers out of the quantum well are responsible for the PL quenching behavior. Also a second nonradiative channel with much lower activation energy was found, the origin of which we believe to be quenching of the bound excitons.
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