Applied Physics Letters · 2015 · 224 citations · 24 references
EngineeringElectrical EngineeringMaterials ScienceElectronic MaterialsSemiconductor DevicesSemiconductor MaterialsLight-emitting DiodesOptoelectronic DevicesSemiconductor Device MaterialsWide Band Gap SemiconductorsWide-bandgap Semiconductor DevicesWide-bandgap SemiconductorsCurrent DensityCurrent Density OptimizationExtraction EfficiencyFlip-chip Light-emitting DiodesLight-emitting DevicesPower ConversionPower Conversion EfficiencySeries Resistance
We report on violet-emitting III-nitride light-emitting diodes (LEDs) grown on bulk GaN substrates employing a flip-chip architecture. Device performance is optimized for operation at high current density and high temperature, by specific design consideration for the epitaxial layers, extraction efficiency, and electrical injection. The power conversion efficiency reaches a peak value of 84% at 85 °C and remains high at high current density, owing to low current-induced droop and low series resistance.
24
Auger recombination in InGaN measured by photoluminescence
Yinchu Shen, Gerd Mueller, Satoshi Watanabe et al. · Applied Physics Letters · 2007 · 1.1K citations
Justin Iveland, Lucio Martinelli, Jacques Peretti et al. · Physical Review Letters · 2013 · 660 citations · Full text