A simple spot-size versus pixel-size criterion for X-ray microanalysis of thin foils

The single-scattering model and spatial resolution in X-ray analysis of thin foils

S. J. B. Reed · Ultramicroscopy · 1982 · 97 citations

Natural Sciences, Materials Engineering, Materials Science +17

The spatial resolution of X-ray microanalysis in the scanning transmission electron microscope

P. Doig, D. Lonsdale, P. E. J. Flewitt · Philosophical magazine. A/Philosophical magazine. A. Physics of condensed matter. Structure, defects and mechanical properties · 1980 · 54 citations

Natural Sciences, Materials Engineering, Materials Science +16

Spatial resolution in x-ray microanalysis of thin foils in stem

Raymond Hutchings, M. H. Loretto, I.P. Jones et al. · Ultramicroscopy · 1978 · 39 citations

Natural Sciences, Materials Engineering, Materials Science +10

Performance of a field emission gun scanning electron microscope column

J. A. Venables · Ultramicroscopy · 1980 · 30 citations

Natural Sciences, Physics, Analytical Chemistry +6

Some aspects of quantitative STEM X‐ray microanalysis*

I.P. Jones, M. H. Loretto · Journal of Microscopy · 1981 · 20 citations

Natural Sciences, Materials Engineering, Materials Science +7