IEEE Transactions on Electron Devices · 1986 · 90 citations · 5 references
EngineeringElectrical EngineeringCircuit TheoryMicroelectronicsSemiconductor DevicesBipolar Junction TransistorsField-effect TransistorsMetal-oxide-semiconductor Field-effect TransistorsNoiseNoise In Electronic DevicesNoise In Semiconductor DevicesBipolar Junction Transistor NoiseCurrent NoiseDevice Noise CharacterizationNoise In Bipolar Junction TransistorsNoise In Field-effect TransistorsNoise SourcesNoise Sources In Semiconductor MaterialsTransistor Noise
The most general case of <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">1/f</tex> noise in transistors can be described by three independent noise current generators: i <inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">be</inf> between base and emitter, i <inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">bc</inf> between base and collector, and i <inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">ec</inf> between emitter and collector. By short-circuiting the base and the collector to ground and comparing the base and collector noise spectra <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">S_{IB}(f)</tex> and <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">S_{IC}(f)</tex> for the case of zero feedback from the emitter with the base and collector noise spectra <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">S'_{IB}(f)</tex> and <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">S'_{IC}(f)</tex> for the case of strong feedback from the emitter, one can evaluate the relative strength of the three noise sources. By measuring the current dependence of <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">S_{IB}(f)</tex> , <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">S_{IC}(f)</tex> , <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">S'_{IB}(f)</tex> , and <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">S'_{IC}(f)</tex> , one can assign physical processes to the current generators i <inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">bc</inf> , i <inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">be</inf> , and i <inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">ec</inf> . It is the aim of this paper to demonstrate theoretically a simple method for locating <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">1/f</tex> noise sources in BJT's and HBJT's by comparing the base and collector <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">1/f</tex> noise for the cases without and with strong emitter feedback. In later papers we shall demonstrate experimentally how this method is applied to practical situations.
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