Ionic Polishing of Optical Surfaces

S. Bashkin, J. F. Nester

Applied Optics · 1966 · 18 citations · 10 references

Concepts

Abstract

The controlled removal of material from the surface of insulators has been observed by using a positive ion beam. In the energy range 0.5-2.0 MeV the sputtering yield was observed to be unity. The application of this technique to the manufacture of high quality optical surfaces is discussed.

References

10