Physical review. B, Solid state · 1970 · 155 citations · 18 references
EngineeringMaterials ScienceElectronic MaterialsOptoelectronicsSemiconductor MaterialsOptical Properties Of SemiconductorsPhotovoltaic DevicesSemiconductor Device MaterialsSemiconductor PhysicsSolar CellsThermal Properties Of SemiconductorsDepletion RegionGeneration ProcessesOptical PropertiesPolarization PotentialRadiative RecombinationSemiconductor CharacterizationSilicon Optical PropertiesThermal Emission Spectra
The thermal emission rates of electrons and holes at the gold acceptor center ${E}_{C}\ensuremath{-}{E}_{\mathrm{Au}\ensuremath{-}}=540$ meV) in silicon are obtained from 200 to 300\ifmmode^\circ\else\textdegree\fi{}K in silicon using the photovoltaic effect in the depletion region of a reverse biased $p\ensuremath{-}n$ junction. The observed electric field dependences are considerably smaller than that predicted by the three-dimensional Poole-Frenkel effect in a Coulombic potential, but closer to that in a polarization potential. The ratio $\frac{{{e}_{n}}^{t}}{{{e}_{p}}^{t}}$ is 50 at 190\ifmmode^\circ\else\textdegree\fi{}K and decreases to 16 at 300\ifmmode^\circ\else\textdegree\fi{}K. The low field values of the thermal emission rates, ${{e}_{n}}^{t}$ and ${{e}_{p}}^{t}$, are used to compute the thermal-capture cross sections of electrons and holes which show ${{\ensuremath{\sigma}}_{n}}^{t}\ensuremath{\propto}{T}^{0}$ and ${{\ensuremath{\sigma}}_{p}}^{t}\ensuremath{\propto}{T}^{\ensuremath{-}4}$ and are consistent with Lax's impurity model. The degeneracy factors obtained from these emission-rate data and the capture-cross-section data of Fairfield and Gokhale are 15 and 7.5 for the electron and hole transitions, which are not inconsistent with those of the one-band model. The photoionization cross sections of electrons and holes and their spectral dependences are also obtained from -56 to -78\ifmmode^\circ\else\textdegree\fi{}C and compared with the $\ensuremath{\delta}$-function impurity potential model of Lucovsky, giving an effective-field ratio of ${(\frac{m}{{m}^{*}})}^{\frac{1}{2}}(\frac{{\ensuremath{\epsilon}}_{\mathrm{eff}}}{{\ensuremath{\epsilon}}_{0}})\ensuremath{\sim}3\ensuremath{-}4$ for holes and \ensuremath{\sim}1.3 for electrons. No temperature and field dependences are observed. Radiative recombination cross sections obtained from detailed balance are 6.3\ifmmode\times\else\texttimes\fi{}${10}^{\ensuremath{-}21}$ ${\mathrm{cm}}^{2}$ for holes and 3\ifmmode\times\else\texttimes\fi{}${10}^{\ensuremath{-}21}$ ${\mathrm{cm}}^{2}$ for electrons at 300\ifmmode^\circ\else\textdegree\fi{}K.
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Statistics of the Recombinations of Holes and Electrons
W. Shockley, W. T. Read · Physical Review · 1952 · 6.4K citations
Cascade Capture of Electrons in Solids
M. Lax · Physical Review · 1960 · 899 citations
Fine Structure in the Absorption-Edge Spectrum of Si
G. G. Macfarlane, Thomas McLean, J E Quarrington et al. · Physical Review · 1958 · 607 citations