Secondary ion yields near 1 for some chemical compounds

Ion Microprobe Mass Analyzer

H. Liebl · Journal of Applied Physics · 1967 · 338 citations

Natural Sciences, Chemistry, Analytical Chemistry +14

Electron Ejection from Solids by Atomic Particles with Kinetic Energy

K.H. Krebs · Fortschritte der Physik · 1968 · 109 citations

Natural Sciences, Physics, Atomic Physics +15

Investigation of low-energy ion scattering as a surface analytical technique

Doug Ball, T.M. Buck, D. MacNair et al. · Surface Science · 1972 · 105 citations

Natural Sciences, Chemistry, Materials Science +12

Untersuchungen zur Emission positiver Sekundärionen aus festen Targets. Die Brauchbarkeit der Ionenbeschuß-Ionenquelle in der Massenspektroskopie

H. E. Beske · Zeitschrift für Naturforschung A · 1967 · 63 citations · Full text

Natural Sciences, Chemistry, Materials Science +14