Concepedia
Journal of Non-Crystalline Solids · 2004 · 20 citations · 7 references
Natural SciencesElectrical EngineeringMaterials ScienceAnalytical ChemistryElectronic MaterialsOptoelectronicsDefect CharacterizationDefect DetectionDefect ModelingDefects In Electronic MaterialsPhotodetectorsDefect AnalysisDefect MetrologyDefect PhysicsPhotocurrent Generation
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How to reach more precise interpretation of subgap absorption spectra in terms of deep defect density in a-Si:H
N. Wyrsch, F. Finger, T. J. McMahon et al. · Journal of Non-Crystalline Solids · 1991 · 165 citations
Natural Sciences, Materials Science, Physics +16
Suppression of interference fringes in absorption measurements on thin films
D. Ritter, K. Weiser · Optics Communications · 1986 · 95 citations
Natural Sciences, Chemistry, Materials Science +12
Direct measurement of the deep defect density in thin amorphous silicon films with the ‘‘absolute’’ constant photocurrent method
M. Vaněček, J. Kočka, A. Poruba et al. · Journal of Applied Physics · 1995 · 93 citations
Natural Sciences, Materials Engineering, Materials Science +17
Subbandgap absorption in a-Si:H from photoconductivity spectra
K. Pierz, H. Mell, J Terukov · Journal of Non-Crystalline Solids · 1985 · 41 citations
Natural Sciences, Materials Science, Physics +14
Analysis of the modulated photocurrent in amorphous semiconductors
Hidetoshi Oheda · Solid State Communications · 1980 · 25 citations