Publication | Closed Access
Electrical analysis of external mechanical stress effects in short channel MOSFETs on (001) silicon
70
Citations
8
References
2003
Year
Electrical EngineeringEngineeringElectrical AnalysisStress-induced Leakage CurrentBias Temperature InstabilityApplied PhysicsShort Channel MosfetsSilicon On InsulatorMechanics Of MaterialsSilicon Debugging
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