Physical Review · 1945 · 20 citations · 5 references
Natural SciencesChemistryMaterials ScienceMaterials CharacterizationOptical MaterialsThin FilmsDielectricsElectrical ConductivityOptical Properties Of MaterialsOptical Properties Of SolidsThin Film Electrical PropertiesThin Film Optical PropertiesDielectric MeasurementMetal Thin FilmsMetallic Thin FilmsOptical CharacterizationOptical ConstantsOptical Thin Film CharacterizationThermo-optic PropertiesThin-film Optical Characterization
Reflectivities of evaporated metal films have been observed under varying conditions, allowing the computation of conductivities and dielectric constants by a previously described method. A reflectometer employing both a photo-cell and a thermopile permitted measurements in the visible and near infra-red regions. Curves are included showing the values of the constants for beryllium, magnesium, zinc, and copper. Comparisons are made with other published results.
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