Fourier transform spectrometer for spectral emissivity measurement in the temperature range between 60 and 1500°C

Abstract

A new spectral emissivity measurement system has been developed at Harbin Institute of Technology (HIT) by using a Fourier transform infrared (FTIR) spectrometer. The spectral range between 0.6 and 25 m was covered by a photovoltaic HgCdTe and a silicon photodiode detector. A SiC heater with a black hole was employed for heating the sample. The temperature of the sample can be controlled in a range between 60 and 1500C with an error of less than 1C. The system was calibrated against two high quality reference blackbodies: a low temperature heat-pipe blackbody operated in the temperature range between 60C and 300C and a high temperature blackbody with SiC heater operated in the temperature range between 300C and 1500C. Several tests were done for this new system. The estimated uncertainty of emissivity measurement is better than 3%.